LabCompass

Pavan Kumar Vaitheeswaran

Engineering · Purdue University West Lafayette

Early career · publishing since 2017

Publications

12

Citations

67

Est. group size

~1

Recurring co-author estimate

Active years

9

Publishing since 2017

Research summary
AI-generated

This researcher works on the reliability and mechanics of electronic packaging materials, particularly how metal interconnects and thin films degrade under electrical current and temperature stress (electromigration). A second strand of work involves computational geometry methods, such as algebraic surface modeling and boundary analysis, used in engineering design and simulation tools. The work bridges materials reliability engineering and computational/numerical methods for geometric modeling.

Electromigration and interconnect reliabilityThin-film and thermal interface material mechanicsElectronic packaging engineeringComputational geometry and algebraic surface modelingPhase-field and continuum mechanics modeling

Publication output has been low and irregular over the last decade, with small yearly counts, a peak of 4 in 2020, and gaps in 2022 and 2024, averaging under one paper per year over the last five years.

Generated by claude-sonnet-5 from public bibliographic data · Jul 20, 2026

Publication cadence
Publications per year over the last 10 years — averaging 0.6/year recently
2017: 1 publication172018: 1 publication182019: 2 publications192020: 4 publications4202021: 1 publication21222023: 2 publications23242025: 1 publication2526
Recent publications
Publishes in
  • IEEE Transactions on Components Packaging and Manufacturing Technology×2
  • Computational Mechanics×1
  • Journal of Electronic Packaging×1
  • Continuum Mechanics and Thermodynamics×1
  • Computer-Aided Design×1
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This profile was generated automatically from public scholarly data (OpenAlex). Group size and activity levels are estimates derived from co-authorship patterns.

Last updated Jul 20, 2026.

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