LabCompass

Michael Jin

Engineering · The Ohio State University

OpenAlex ORCID
Established · publishing since 1990Rising activity
Silicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignElectromagnetic Compatibility and Noise SuppressionIntegrated Circuits and Semiconductor Failure Analysis

Publications

50

Citations

256

Est. group size

~10

Recurring co-author estimate

Active years

37

Publishing since 1990

Research summary
AI-generated

Michael Jin's research focuses on the reliability and failure analysis of silicon carbide (SiC) power transistors, particularly a type called MOSFETs used in high-voltage electronics. His work develops methods to test and screen these devices for defects—such as short-circuit tolerance, gate oxide breakdown, and avalanche stress—to improve their consistency and durability for use in power electronics applications like electric vehicles and industrial equipment. This is a highly applied, device-testing-oriented area of electrical and semiconductor engineering.

SiC power MOSFET reliabilityShort-circuit and avalanche stress testingGate oxide degradation and screening methodsSemiconductor device failure analysisPower electronics device characterization

Publication output was minimal or absent before 2021 but has grown substantially since, peaking around 2024 with a slight decline in 2025, indicating a recent and rapidly expanding research program.

Generated by claude-sonnet-5 from public bibliographic data · Jul 20, 2026

Publication cadence
Publications per year over the last 10 years — averaging 6.8/year recently
2017: 1 publication171819202021: 2 publications212022: 5 publications222023: 7 publications232024: 12 publications12242025: 9 publications252026: 1 publication26
Recent publications
Publishes in
  • Electronics×5
  • IEEE Transactions on Electron Devices×4
  • Micromachines×2
  • IEEE Transactions on Power Electronics×2
  • Materials Science in Semiconductor Processing×1
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This profile was generated automatically from public scholarly data (OpenAlex). Group size and activity levels are estimates derived from co-authorship patterns.

Last updated Jul 19, 2026.

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