LabCompass

Irith Pomeranz

Engineering · Purdue University West Lafayette

OpenAlex
Mid career · publishing since 2003
Integrated Circuits and Semiconductor Failure AnalysisVLSI and Analog Circuit TestingRadiation Effects in ElectronicsPhysical Unclonable Functions (PUFs) and Hardware SecurityLow-power high-performance VLSI design

Publications

20

Citations

110

Est. group size

—

Recurring co-author estimate

Active years

23

Publishing since 2003

Research summary
AI-generated

Irith Pomeranz works on testing methods for computer chips (integrated circuits), focusing on how to detect manufacturing defects and aging-related faults in digital hardware. Recent work looks at problems like double transition faults from chip aging, bridging faults (unwanted electrical connections between circuit wires), and improving test sequences that check whether a chip's functions work correctly. This research is relevant to students interested in hardware reliability, VLSI (very-large-scale integration) circuit design, and semiconductor testing.

VLSI test and fault modelingChip aging and reliabilityBridging and transition fault analysisFunctional test sequence designSemiconductor failure analysis

Publication counts were essentially flat with no recorded output for most of the last decade, followed by a small uptick in 2024-2025.

Generated by claude-sonnet-5 from public bibliographic data · Jul 20, 2026

Publication cadence
Publications per year over the last 10 years — averaging 0.6/year recently
171819202122232024: 1 publication242025: 2 publications22526
Recent publications
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This profile was generated automatically from public scholarly data (OpenAlex). Group size and activity levels are estimates derived from co-authorship patterns.

Last updated Jul 20, 2026.

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