T. D. Loveless

Engineering · Indiana University

Radiation Effects in Electronics VLSI and Analog Circuit Testing Semiconductor materials and devices Integrated Circuits and Semiconductor Failure Analysis Low-power high-performance VLSI design

Publications

102

Citations

2,181

Est. group size

—

Recurring co-author estimate

Active years

Publishing since 2006

Research summary

AI-generated

T. D. Loveless works in electrical/computer engineering on how integrated circuits (the chips inside electronic devices) respond to radiation and noise, and on identifying wireless devices by their unique signal characteristics. Research includes studying radiation-induced errors in CMOS chips and using machine learning to characterize these effects, as well as "RF fingerprinting" methods that recognize individual radio transmitters to improve security in Internet-of-Things networks.

Radiation effects in electronic circuitsMachine learning for microelectronics analysisRF fingerprinting and emitter identificationIoT and wireless device securityCMOS device characterization and testing

Publication activity has been steady over the last decade, averaging about four papers per year with a modest peak in 2023-2024.

Generated by claude-opus-4-8 from public bibliographic data · Jul 11, 2026

Publication cadence

Publications per year over the last 10 years — averaging 4.0/year recently

Recent publications

Total-Ionizing-Dose Effects and Low-Frequency Noise in 90 nm, 3.3 V Input/Output CMOS Devices
IEEE Transactions on Nuclear Science · 2026
Simplifying Multi-Domain Specific Emitter Identification
2025
Improving RF-DNA Fingerprinting Performance in an Indoor Multipath Environment Using Semi-Supervised Learning
IEEE Transactions on Information Forensics and Security · 2024
Improved RF Fingerprint-based Identity Verification in the Presence of an SEI Mimicking Adversary
Journal of Cyber Security and Mobility · 2024
On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS
2024
Enhancing internet of things security using entropy-informed RF-DNA fingerprint learning from Gabor-based images
EURASIP Journal on Information Security · 2024
Heavy-Ion SET and SEL Response of a Wide-Band Operational Amplifier Fabricated in the Sky Water S90LN 90 nm Process
2024
Built-In Self-Test Measurement of Single Event Transients in the Skywater S90ln 90 Nm Process
2024
Preamble-based RF-DNA Fingerprinting Under Varying Temperatures
2023
RF Fingerprint-based Identity Verification in the Presence of an SEI Mimicking Adversary
2023
CNN-based Emitter ID-Verification and Rogue Emitter Rejection for IoT Networks using Entropy-Informed RF-DNA Fingerprints
2023
Assessing Adversarial Replay and Deep Learning-Driven Attacks on Specific Emitter Identification-based Security Approaches
arXiv (Cornell University) · 2023
Supervised Deep Learning and Classification of Single-Event Transients
IEEE Transactions on Nuclear Science · 2023
Analysis of Single Event Transients in Arbitrary Waveforms Using Statistical Window Analysis
IEEE Transactions on Nuclear Science · 2023
Effects of Total Ionizing Dose on SRAM Physical Unclonable Functions
IEEE Transactions on Nuclear Science · 2022

Publishes in

IEEE Transactions on Nuclear Science×16
IEEE Transactions on Information Forensics and Security×2
arXiv (Cornell University)×2
IEEE Internet of Things Journal×1
IEEE Transactions on Smart Grid×1

This profile was generated automatically from public scholarly data (OpenAlex). Group size and activity levels are estimates derived from co-authorship patterns.

Last updated Jul 11, 2026.

Claim or correct this profile