Adrian Ildefonso

Engineering · Indiana University

Radiation Effects in Electronics Semiconductor materials and devices Advancements in Semiconductor Devices and Circuit Design Integrated Circuits and Semiconductor Failure Analysis Radio Frequency Integrated Circuit Design

Publications

Citations

882

Est. group size

—

Recurring co-author estimate

Active years

Publishing since 2015

Publication cadence

Publications per year over the last 10 years — averaging 6.2/year recently

Recent publications

Analysis of Optical and Electrical Single-Event Transients in Integrated Silicon Photonic Microring Modulators
IEEE Transactions on Nuclear Science · 2026
TUT11 - Radiation Effects in Photonic Integrated Circuits
Underline Science Inc. · 2026
Universal Approach to Measuring Focused Beam Size for Pulsed-Laser SEE Testing
IEEE Transactions on Nuclear Science · 2026
Single-Event Transients in Vertical GaN Diodes With N-Implanted Hybrid Edge Termination
IEEE Transactions on Nuclear Science · 2025
A Framework for Determining System-Level SEE Vulnerabilities in Wireless RF Receivers
IEEE Transactions on Nuclear Science · 2025
Implications of Elevated Temperatures on the Accuracy of Pulsed-Laser SEE Testing
IEEE Transactions on Nuclear Science · 2025
A Hierarchical Framework for Classifying Analog Single-Event Transients by Shape
IEEE Transactions on Nuclear Science · 2025
System-Level SEU Hardening of Wireless Receivers Through Modulation Scheme Selection
IEEE Transactions on Nuclear Science · 2025
CHALICE: Calculator for Highly Accurate Laser-Induced Carrier Excitation
2025
How to Consider SEEs When Designing a SiGe Low-Noise Amplifier—An Overview
IEEE Transactions on Nuclear Science · 2024
Single-Event Transient Study of Ga₂O₃ Rectifiers
IEEE Transactions on Nuclear Science · 2024
Mitigation of single-event transients in high-frequency analog circuits using choke inductors
Nuclear Engineering and Technology · 2024
Comparing Third-Order Digital Modulation Schemes for SEU Resilience in RF Receivers Due to SETs in the SiGe LNA
IEEE Transactions on Nuclear Science · 2024
Quantitative Laser Testing for Predicting Heavy-Ion SEE Response—Part 2: Accurately Determining Laser-Equivalent LET
IEEE Transactions on Nuclear Science · 2023
Quantitative Laser Testing for Predicting Heavy-Ion SEE Response—Part 1: Metrics for Assessing Response Agreement
IEEE Transactions on Nuclear Science · 2023

Publishes in

IEEE Transactions on Nuclear Science×47
ECS Journal of Solid State Science and Technology×2
IEEE Transactions on Electron Devices×2
arXiv (Cornell University)×2
IEEE Transactions on Microwave Theory and Techniques×1

This profile was generated automatically from public scholarly data (OpenAlex). Group size and activity levels are estimates derived from co-authorship patterns.

Last updated Jul 9, 2026.

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