Adrian Ildefonso
Engineering · Indiana University
Publications
74
Citations
882
Est. group size
—
Recurring co-author estimate
Active years
12
Publishing since 2015
Adrian Ildefonso studies how radiation (such as cosmic particles or focused laser pulses) affects electronic and photonic circuits, especially the brief electrical glitches known as single-event transients that occur when a particle strikes a device. The work spans measuring and modeling these effects in materials and components (like SiGe transistors, GaN and Ga2O3 diodes, and silicon photonic modulators) and designing more resilient systems such as wireless radio-frequency receivers for space applications. Much of the research is aimed at making electronics reliable in the harsh radiation environment of space.
Publication activity has been fairly steady over the decade, averaging about six papers per year over the last five years with some year-to-year fluctuation.
Generated by claude-opus-4-8 from public bibliographic data · Jul 9, 2026
Typically publishes in teams of ~9 · 1% small-team papers (≤3 authors) · across 12 venues
- Analysis of Optical and Electrical Single-Event Transients in Integrated Silicon Photonic Microring Modulators
IEEE Transactions on Nuclear Science · 2026
- TUT11 - Radiation Effects in Photonic Integrated Circuits
Underline Science Inc. · 2026
- Universal Approach to Measuring Focused Beam Size for Pulsed-Laser SEE Testing
IEEE Transactions on Nuclear Science · 2026
- System-Level SEU Hardening of Wireless Receivers Through Modulation Scheme Selection
IEEE Transactions on Nuclear Science · 2025
- A Framework for Determining System-Level SEE Vulnerabilities in Wireless RF Receivers
IEEE Transactions on Nuclear Science · 2025
- Single-Event Transients in Vertical GaN Diodes With N-Implanted Hybrid Edge Termination
IEEE Transactions on Nuclear Science · 2025
- Implications of Elevated Temperatures on the Accuracy of Pulsed-Laser SEE Testing
IEEE Transactions on Nuclear Science · 2025
- A Hierarchical Framework for Classifying Analog Single-Event Transients by Shape
IEEE Transactions on Nuclear Science · 2025
- CHALICE: Calculator for Highly Accurate Laser-Induced Carrier Excitation
2025
- How to Consider SEEs When Designing a SiGe Low-Noise Amplifier—An Overview
IEEE Transactions on Nuclear Science · 2024
- Single-Event Transient Study of Ga₂O₃ Rectifiers
IEEE Transactions on Nuclear Science · 2024
- Mitigation of single-event transients in high-frequency analog circuits using choke inductors
Nuclear Engineering and Technology · 2024
- Comparing Third-Order Digital Modulation Schemes for SEU Resilience in RF Receivers Due to SETs in the SiGe LNA
IEEE Transactions on Nuclear Science · 2024
- Quantitative Laser Testing for Predicting Heavy-Ion SEE Response—Part 2: Accurately Determining Laser-Equivalent LET
IEEE Transactions on Nuclear Science · 2023
- Quantitative Laser Testing for Predicting Heavy-Ion SEE Response—Part 1: Metrics for Assessing Response Agreement
IEEE Transactions on Nuclear Science · 2023
- IEEE Transactions on Nuclear Science×46
- ECS Journal of Solid State Science and Technology×2
- IEEE Transactions on Electron Devices×2
- arXiv (Cornell University)×2
- IEEE Transactions on Microwave Theory and Techniques×1
- T. D. Loveless
Engineering · Indiana University
- Joel M. Hatch
Engineering · The Ohio State University
- Nathan J. Conrad
Engineering · Purdue University West Lafayette
- C. Parker
Engineering · Indiana University
- Marvin H. White
Engineering · The Ohio State University
This profile was generated automatically from public scholarly data (OpenAlex). Group size and activity levels are estimates derived from co-authorship patterns.
Last updated Jul 27, 2026.
Claim or correct this profile