L. J. Brillson

This researcher studies the atomic-scale defects and electronic structure at the surfaces and interfaces of semiconductor and oxide materials, using techniques like cathodoluminescence spectroscopy (a method that maps light emission to detect defects) and photoelectron spectroscopy. Recent work spans wide-bandgap semiconductors (Ga2O3, GaN, ZnO), transparent conducting oxides (ITO), and battery-related materials (V2O5, LiPON), connecting fundamental defect physics to applications in electronics, piezoelectric devices, and solid-state batteries. This research area sits at the intersection of materials science and electrical engineering, focused on understanding how tiny imperfections in materials affect device performance.

Publication output has been relatively steady but modest over the past decade, with a peak in 2020 (12 papers) followed by a gradual decline to around 3-6 papers per year in recent years.

Generated by claude-sonnet-5 from public bibliographic data · Jul 20, 2026