Sunbin Deng
Engineering · Purdue University West Lafayette
Publications
102
Citations
1,249
Est. group size
~3
Recurring co-author estimate
Active years
11
Publishing since 2015
Sunbin Deng's research focuses on metal-oxide thin-film transistors (TFTs), particularly indium-tin-zinc-oxide (InSnZnO) devices, examining how they degrade and become unreliable under electrical stress and environmental conditions like moisture exposure. The work also extends to applications of these transistors in circuits such as amplifiers and oscillators, plus related work on perovskite materials for sensing, light-emitting, and photodetector devices.
Publication output has been relatively steady over the past decade with year-to-year fluctuations, showing a dip in 2022 followed by a rebound in 2023-2024, though 2025 shows a marked decline (likely reflecting incomplete recent data).
Generated by claude-sonnet-5 from public bibliographic data · Jul 20, 2026
- Low-frequency noise in InSnZnO thin film transistors with high-quality SiO2 gate oxide stacks
Applied Physics Letters · 2024
- Reliability of indium-tin-zinc-oxide thin-film transistors under dynamic drain voltage stress
Applied Physics Letters · 2024
- Degradation of InSnZnO Thin-Film Transistors Under Negative Bias Stress
IEEE Transactions on Electron Devices · 2023
- Significant Degradation Reduction in Metal Oxide Thin-Film Transistors via the Interaction of Ionized Oxygen Vacancy Redistribution, Self-Heating Effect, and Hot Carrier Effect
IEEE Transactions on Electron Devices · 2023
- Hot Carrier Degradation Accompanied by Recovery in InSnZnO Thin-Film Transistors
IEEE Electron Device Letters · 2023
- Controllable Transformation of 2D Perovskite for Multifunctional Sensing Properties
The Journal of Physical Chemistry C · 2023
- 85‐1: Ultrahigh‐Resolution Corrugated Silicon Nitride Masks for Direct Patterning of OLED Microdisplays
SID Symposium Digest of Technical Papers · 2023
- Long-Term Recovery Behavior in InSnZnO Thin-Film Transistors after Negative Bias Stress
2023
- In-Situ Fluorine-Doped Znsno Thin Film and Thin-Film Transistor
SSRN Electronic Journal · 2023
- Evaluation of Positive-Bias-Stress-Induced Degradation in InSnZnO Thin-Film Transistors by Low Frequency Noise Measurement
IEEE Electron Device Letters · 2022
- Gate Dielectric Treated by Self-Assembled Monolayers (SAMs) to Enhance the Performance of InSnZnO Thin-Film Transistors
IEEE Transactions on Electron Devices · 2022
- Effect of Moisture Exchange Caused by Low‐Temperature Annealing on Device Characteristics and Instability in InSnZnO Thin‐Film Transistors
Advanced Materials Interfaces · 2022
- Effect of Moisture Exchange Caused by Low‐Temperature Annealing on Device Characteristics and Instability in InSnZnO Thin‐Film Transistors (Adv. Mater. Interfaces 14/2022)
Advanced Materials Interfaces · 2022
- A Differential Ring Oscillator With Tail Current Source Control Scheme Using N-Type Oxide TFTs
IEEE Transactions on Electron Devices · 2022
- 34.4: 3‐inch, 3000‐ppi Silicon Nitride Masks for Direct Patterning of OLED Microdisplays
SID Symposium Digest of Technical Papers · 2022
- IEEE Electron Device Letters×13
- IEEE Transactions on Electron Devices×13
- SID Symposium Digest of Technical Papers×11
- IEEE Journal of the Electron Devices Society×4
- Advanced Functional Materials×3
- Zhuocheng Zhang
Engineering · Purdue University West Lafayette
- Pai-Ying Liao
Engineering · Purdue University West Lafayette
- Jie Zhang
Engineering · Purdue University West Lafayette
- Haiyan Wang
Engineering · Purdue University West Lafayette
- J.K. Rath
Engineering · Purdue University West Lafayette
This profile was generated automatically from public scholarly data (OpenAlex). Group size and activity levels are estimates derived from co-authorship patterns.
Last updated Jul 20, 2026.
Claim or correct this profile