James Moyne
Engineering · University of Michigan
Publications
160
Citations
4,812
Est. group size
~3
Recurring co-author estimate
Active years
37
Publishing since 1989
Typically publishes in teams of ~4 · 50% small-team papers (≤3 authors) · across 6 venues
- A Comparative Study of Semiconductor Virtual Metrology Methods and Novel Algorithmic Framework for Dynamic Sampling
IEEE Transactions on Semiconductor Manufacturing · 2025
- Determining Investment Opportunities and Directions for Artificial Intelligence and Machine Learning Applied to Digital Twin Technology in Semiconductor Manufacturing
2025
- How Lithography and Metrology Are Enabling Yield in the Next Generation of Semiconductor Patterning
Computer · 2024
- An Adaptive Modeling Framework for Bearing Failure Prediction
Electronics · 2022
- Run-to-Run Control in Semiconductor Manufacturing
Encyclopedia of Systems and Control · 2021
- Combining Feature Extraction-Based and Full Trace Analysis Capabilities in Fault Detection: Methods and Comparative Analysis
2021
- Merging Subject Matter Expertise and Deep Convolutional Neural Network for State-Based Online Machine-Part Interaction Classification
Volume 2: Manufacturing Processes; Manufacturing Systems; Nano/Micro/Meso Manufacturing; Quality and Reliability · 2021
- Factory Integration
2021
- A Framework for Semi-Automated Fault Detection Configuration with Automated Feature Extraction and Limits Setting
2020
- An Online Virtual Metrology Model With Sample Selection for the Tracking of Dynamic Manufacturing Processes With Slow Drift
IEEE Transactions on Semiconductor Manufacturing · 2019
- Run-to-Run Control in Semiconductor Manufacturing
Encyclopedia of Systems and Control · 2019
- Virtual Metrology White Paper - INTERNATIONAL ROADMAP FOR DEVICES AND SYSTEMS(IRDS)
2018
- Multizone Uniformity Control of a CMP Process Utilizing a Pre- and Postmeasurement Strategy
2018
- Determining a security roadmap for the microelectronics industry
2018
- Advancements in Chemical Mechanical Planarization Process Automation and Control
2018
- IEEE Access×3
- IEEE Transactions on Semiconductor Manufacturing×3
- Encyclopedia of Systems and Control×2
- arXiv (Cornell University)×2
- Processes×1
- Hao Pan
Engineering · University of Michigan
- Hejun Huang
Engineering · University of Michigan
- Dennis Bernstein
Engineering · University of Michigan
- Anton Bougaev
Engineering · Purdue University West Lafayette
- Huayi Li
Engineering · University of Michigan
This profile was generated automatically from public scholarly data (OpenAlex). Group size and activity levels are estimates derived from co-authorship patterns.
Last updated Jul 25, 2026.
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