Weilun Chao
Physics and Astronomy · The Ohio State University
Publications
260
Citations
4,435
Est. group size
—
Recurring co-author estimate
Active years
27
Publishing since 2000
Weilun Chao's work centers on x-ray imaging and lithography techniques, including extreme ultraviolet (EUV) lithography tool characterization, soft x-ray scattering for studying materials at nanoscale, and electron microscopy methods applied to magnetic and electrochemical materials. Some recent outputs also involve computer vision and machine learning benchmarks, suggesting collaborative or interdisciplinary work bridging physics instrumentation with data-driven analysis methods. This research is relevant to students interested in x-ray optics, nanofabrication metrology, and materials characterization techniques.
Publication output was moderate and variable from 2017-2023, then increased notably in 2024 and 2025, suggesting growing recent activity.
Generated by claude-sonnet-5 from public bibliographic data · Jul 20, 2026
- Pattern-enhanced Resonant Soft X-ray Scattering for Operando monitoring of electrochemical solid-liquid interfaces
Nature Communications · 2026
- Binary pseudo-random array standard for extreme ultraviolet lithography tool characterization
Optical Engineering · 2026
- Terrace‐Edge‐Induced Domain Nucleation in Room‐Temperature 2D Magnetic Van Der Waals Heterostructures (Adv. Funct. Mater. 23/2026)
Advanced Functional Materials · 2026
- Terrace‐Edge‐Induced Domain Nucleation in Room‐Temperature 2D Magnetic Van Der Waals Heterostructures
Advanced Functional Materials · 2025
- Finer-CAM: Spotting the Difference Reveals Finer Details for Visual Explanation
2025
- Finer-CAM: Spotting the Difference Reveals Finer Details for Visual Explanation
arXiv (Cornell University) · 2025
- Mixed Signals: A Diverse Point Cloud Dataset for Heterogeneous LiDAR V2X Collaboration
2025
- Mask-side Hyper-NA EUV imaging on the SHARP microscope
Journal of Micro/Nanopatterning Materials and Metrology · 2025
- Characterization of latent image of resist materials via critical-dimension resonant soft x-ray scattering
2025
- Using a FEM-based Maxwell solver and CD-RSoXS measurement for the analysis of photoresist pattern
2025
- Binary pseudo-random array for transfer function calibration of interferometers with transmission spheres and cylinders
2025
- Demonstration of a dual-beam zone plate for phase-contrast coherent soft x-ray imaging
2025
- Binary pseudo random array standard for EUV lithography tool characterization
2025
- AVA-Bench: Atomic Visual Ability Benchmark for Vision Foundation Models
arXiv (Cornell University) · 2025
- Building Machine Learning Challenges for Anomaly Detection in Science
arXiv (Cornell University) · 2025
- arXiv (Cornell University)×9
- Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE×5
- Nature Communications×3
- NPG Asia Materials×3
- Journal of Micro/Nanopatterning Materials and Metrology×3
- R. Garrett
Physics and Astronomy · The Ohio State University
- Zhifeng Huang
Physics and Astronomy · Purdue University West Lafayette
- Alejandro Figueroa Bengoa
Physics and Astronomy · Purdue University West Lafayette
- Stephen M. Durbin
Physics and Astronomy · Purdue University West Lafayette
- Daoyi Li
Biochemistry, Genetics and Molecular Biology · Purdue University West Lafayette
This profile was generated automatically from public scholarly data (OpenAlex). Group size and activity levels are estimates derived from co-authorship patterns.
Last updated Jul 19, 2026.
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